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GeM Registration - 35033427

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GeM Registration

GeM Registration for tender Gem Bids For Atomic Force Microscope (afm) , Nano Indenter , Micro Hardness Tester , X-ray Diffraction (xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy( Ftir) , Energy Dispersive Spectrometry (edx) & Electron Backscattered Diffraction (ebsd) , Co-ordinate Measuring Machine (cmm) , Form Tester , Stereo Microscopy , Sample Preparation , Surface Roughness Tester (contact Type)

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