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Reference # :
35033427
Description :
Tenders for Gem Bids For Atomic Force Microscope (afm) , Nano Indenter , Micro Hardness Tester , X-ray Diffraction (xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy( Ftir) , Energy Dispersive Spectrometry (edx) & Electron Backscattered Diffraction (ebsd) , Co-ordinate Measuring Machine (cmm) , Form Tester , Stereo Microscopy , Sample Preparation , Surface Roughness Tester (contact Type)
Key Values
Value :
NA
EMD :
NA
Doc. Cost :
NA
Key Dates
Due date :
25 Aug, 2025
Location
Location :
Karnataka
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Short Summary :
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Technical Support :
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